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SEM Integration, LLC

Camarillo, California, USA

Phone: +1.888.540.7714   

Fax: +1.888.540.7714

Email: info@SEMintegration.com

Mail: info@semintegration.com
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Dynamic beam profile measurement system

DYNAMIC BEAM PROFILE MEASUREMENT SYSTEM


This profile measurement system is designed to measure both static and dynamic characteristics of a beam with high throughput.  By applying various force profiles across the beam, the system determines bending ability and sorts out defective beam based on conditions set in parameters.

The software allows both continuous beam scan to get overall shape under stress, and step scan to focus on particular locations on the beam. In addition, the tool can be programmed to map out entire surface of a beam by scanning across at different vertical postions.

Advanced data acquisition system

Dynamic beam profile measurement system

Laser interferometer

Closed-loop back-side lapping system


DATA STORAGE / SLIDER FAB

 KEY FEATURES

Capable of applying any force profile and measure beam response

Yes


Capable of mapping out beam surface profile

Yes


Maximum beam length

100 mm


Scanning speed

10 mm/sec


Measurement accuracy

1 um


Actuator force

± 300 g




Please contact us to discuss your applications.